Test System Development
Advanced testing systems from Nemco.Different customers have varied demands for the level of test applied to products before delivery and we pride ourselves on our ability to meet these requirements.
We have a range of facilities in house and can provide programming or full test system development for those listed below. The test solution will be optimised to the production volumes with ‘bed of nails’ fully automated solutions developed for high volumes. Application areas range from high resolution analogue, RF up to 5GHz, embedded processor and other digital applications.
• Flying probe test
• Boundary Scan, JTAG and XJTAG
• In Circuit test (Teradyne)
• Cirrus cable testing, high voltage and high test point count logic level
• Functional test using test boxes supplied by the customer or developed by Nemco
• Labview based functional testing
• Device programming, which can be combined with test options above
We can carry out thermal cycling in house and in conjunction with an external partner temperature and vibration stress testing.